Presentation Title

Techniques in Applied Ellipsometry: An Investigation into Optical Properties of Materials

Format of Presentation

Poster to be presented Friday March 31, 2017

Abstract

Measurements of optical properties provide insight into how materials interact with electromagnetic waves (light). The index of refraction, for example, can be used to identify materials and is used to determine the focusing and dispersive power of lenses and prisms. An ellipsometer is a device that measures optical properties of both conducting and insulating materials by measuring the polarization of reflected light. We have constructed an automated ellipsometer and used it to measure the index of refraction and the transmission coefficients. Bicron was used as the calibration sample because its optical properties are well understood. An interesting application of our device is measuring small changes in optical properties over time. A thin aluminum film was made by vacuum evaporation and is expected to slowly oxidize in air. The ellipsometer was used to test this hypothesis.

Department

Physics

Faculty Advisor

Normand Fortier and Mark Paetkau

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Techniques in Applied Ellipsometry: An Investigation into Optical Properties of Materials

Measurements of optical properties provide insight into how materials interact with electromagnetic waves (light). The index of refraction, for example, can be used to identify materials and is used to determine the focusing and dispersive power of lenses and prisms. An ellipsometer is a device that measures optical properties of both conducting and insulating materials by measuring the polarization of reflected light. We have constructed an automated ellipsometer and used it to measure the index of refraction and the transmission coefficients. Bicron was used as the calibration sample because its optical properties are well understood. An interesting application of our device is measuring small changes in optical properties over time. A thin aluminum film was made by vacuum evaporation and is expected to slowly oxidize in air. The ellipsometer was used to test this hypothesis.